摘要
Thin films of Pr(0.5)Ca(0.5)MnO(3) were fabricated on (001) oriented SrLaAlO(4), NdGaO(3), and SrTiO(3) substrates using a hybrid solution route and spin coating techniques. Good crystalline and epitaxial quality of the films was confirmed with X-ray diffraction and transmission electron microscopy studies. Strain in the film grown on NdGaO(3) substrate did not relax during annealing process and the film exhibited charge-ordered insulator phase at low temperatures even with magnetic fields up to 9 T. However, the films on SrLaAlO(4) and SrTiO(3) substrates (with partially relaxed compressive and tensile strain, respectively) displayed melting of the charge-ordered phase with applied magnetic fields of less than 5 T. The results suggest that strain-relaxation rather than only the type of strain plays an important role in lowering critical melting magnetic fields in these films.
- 出版日期2011-7-1
- 单位Los Alamos