摘要
Zirconium thin films were grown on high carbon steel substrates EN C100 (1%wt. of carbon) by RF magnetron sputtering. In order to study the diffusivity of the film/substrate system as a function of the temperature, 1 h vacuum annealing was carried out for different temperatures between 600 degrees C and 1100 degrees C. The films were then analyzed by X-ray diffraction, scanning electron microscopy, glow discharge optical emission spectroscopy (GDOES) and nanoindentation. The obtained results showed a progressive transformation of zirconium film to.zirconium carbide. Carbon atoms diffusion from substrate toward the film induced this transformation. The sample annealed at 900 C exhibited the best mechanical properties (H = 17 GPa and E = 220 GPa). Samples treated at higher temperature were affected by oxidation and high microporosity. Even if the conversion is incomplete, annealing significantly promotes adhesion of the film on the substrate.
- 出版日期2016-3