An adaptive fault detection threshold hardware circuit design to reduce False Alarms

作者：Cui Y^*; Shi J; Chen L; Liu K; An W

来源：PROCEEDINGS OF THE EUROPEAN SAFETY AND RELIABILITY CONFERENCE (ESREL), 2014-09-14 to 2014-09-18.

Built-In Tests (BITs), responsible for detecting and isolating faults, are widely used in mechanical and electronic products to improve reliability and testability. However, the False Alarm (FA) phenomenon greatly reduces the BIT accuracy and credibility, which becomes one of the most troublesome problem in BIT applications. Compared with the single-threshold fault detection method, an adaptive and automatically adjustable threshold for determining the current state would better to reduce false alarms. In this paper, an adaptive fault detection threshold hardware circuit is designed and tested. The concept of the adaptive fault detection threshold strategy is introduced at the beginning. The outlines and details of circuit design implementations are also discussed, including the function requirements, input/output specifications, and implementation tools. Finally, a hardware BIT circuit board monitoring a typical fault mode is made out, and a performance analysis of the hardware design is carried out.

• 出版日期2015
• 单位北京航空航天大学