A 0.32-THz SiGe Imaging Array With Polarization Diversity

作者：Li, Zhuang^*; Qi, Bukun; Zhang, Xiaohui; Zeinolabedinzadeh, Saeed; Sang, Lei; Cressler, John D.

来源：IEEE Transactions on Terahertz Science and Technology, 2018, 8(2): 215-223.

DOI：10.1109/TTHZ.2017.2787958

• Dual polarization
• imaging array
• incoherent detector
• silicon germanium (SiGe)
• terahertz (THz)
• THz imaging

A 0.32-THz 7x7 SiGe HBT incoherent detector array with both horizontal and vertical polarization capability is implemented in 0.13-mu m SiGe BiCMOS technology. The average responsivity of the detector is 2.7 and 2.49 kV/W from 316 to 324 GHz for the horizontal and vertical polarizations, respectively, with a corresponding noise equivalent power of 23.8 and 25.8 pW/root Hz at an IF of 78.125 kHz. The contrast of metallic objects with features below the diffraction limit is enhanced by utilizing this chip's polarization diversities.

• 出版日期2018-3
• 单位合肥工业大学; 中国科学技术大学