All metal nanoelectromechanical switch working at 300 degrees C for rugged electronics applications

作者:Qian You; Soon Bo Woon; Singh Pushpapraj; Campanella Humberto; Lee Chengkuo*
来源:Nanoscale, 2014, 6(11): 5606-5611.
DOI:10.1039/c3nr05255a

摘要

An all metal based electrostatic nanoelectromechanical switch has been fabricated using a one mask process. High temperature cycling behavior is demonstrated in a vacuum chamber at 300 degrees C for more than 28 hours. The compelling results indicate that the design is promising for the realization of rugged electronics with three-dimensional integration.

  • 出版日期2014-6-7