摘要

A mixed-mode through-reflect-line (TRL) calibration algorithm based on symmetrical reflection standard was proposed to accurately characterize coupled differential devices using scattering parameters. Using the transition structure';s generalized reciprocity and the phase relationship between its scattering matrix entries, the sign ambiguity was removed and the transition structure';s mixed mode wave transfer matrix was obtained. The calibration standards of the proposed algorithm are similar to the requirement of traditional single-mode TRL algorithm, and unsymmetrical structured reflection standard is not necessary to yield mode conversion. To verify the proposed algorithm, the single-mode scattering matrix of calibration standards and device-under-test (DUT), both of which are embedded with the transition structures, were calculated from full-wave electromagnetic simulation, and the proposed algorithm was used to process the simulation data to calculate the DUT';s mixed-mode scattering matrix. The calibration results were compared with that from full-wave simulation, and the agreement of the data obtained through both approaches indicates that the proposed algorithm is valid to calibrate linear differential devices.

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