Accounting for variability in the design of circuits with organic thin-film transistors

作者：Myny Kris^*; van Lieshout Pieter; Genoe Jan; Dehaene Wim; Heremans Paul

来源：Organic Electronics, 2014, 15(4): 937-942.

DOI：10.1016/j.orgel.2014.01.020

• Variability
• Organic electronics
• Organic circuits
• RFID
• Pelgrom
• Mismatch
• TFT
• Thin-film transistor
• Yield

We experimentally verify that the methodology to account for local parameter variations and transistor mismatch known in Si CMOS technologies can be transposed to organic thin-film transistor technologies, and we present a design case that makes use of design for variability. Transistor parameter variation decreases with the square root of the transistor footprint. As a consequence, Monte Carlo simulations which take this effect into account can be executed to better predict the final circuit yield. The design case in this work is an 8-bit, organic RFID transponder chip. The yield prediction by simulations corresponds to the finally observed circuit yield.

• 出版日期2014-4
• 单位KU Leuven