Acute toxicity and risk of infection during total skin electron beam therapy for mycosis fungoides

作者：Lloyd Shane; Chen Zhe; Foss Francine M; Girardi Michael; Wilson Lynn D^*

来源：Journal of the American Academy of Dermatology, 2013, 69(4): 537-543.

DOI：10.1016/j.jaad.2013.04.063

• extracorporeal photopheresis
• infection
• mycosis fungoides
• race
• radiation therapy
• toxicity

Background: Detailed rates of acute toxicity and skin infection during total skin electron beam therapy (TSEBT) for mycosis fungoides have not been reported in a large, modern series.
Objective: We sought to demonstrate the rates of acute toxicity and skin infection during TSEBT.
Methods: We retrospectively reviewed 89 consecutive courses of TSEBT. In all, 82 courses were prescribed a dose of 30 to 36 Gy and were included in the toxicity analysis. We recorded the types and grades of acute treatment toxicities and the incidence of infection during TSEBT for comparison with the previously documented baseline incidence of infection in mycosis fungoides.
Results: The most common toxicities included erythema/desquamation (76%), blisters (52%), hyperpigmentation (50%), and skin pain (48%). The worst reported toxicity grade per patient was grade 1 in 21%, grade 2 in 67%, and grade 3 in 10%, with no grade 4 or 5 toxicities. According to the previously reported rate, a total of 2.4 infections were expected for our cohort at baseline. The number with skin infection was 26 (32%) (relative risk 10.8, P < .01), and of these, 12 (15%) were culture confirmed (relative risk 5.0, P < .01).
Limitations: This was a retrospective study design.
Conclusion: The risk of cutaneous infection is significant during TSEBT.

• 出版日期2013-10