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摘要
The forming-free (FF) and forming-required (FR) resistive switching behaviors of Pt/TaOx/Pt structures were analyzed. Changes in the length and shape of the conducting filaments (CFs) suggested different evolution processes in the FF and FR cells when the CFs grew from weaker filaments to stronger ones. In the FR cells, the filament changed from a conical shape to a cylindrical shape with no change in length. In the FF cells, the filament maintained a cylindrical shape while increasing its diameter and decreasing its length.
- 出版日期2013-4-15
