A soft X-ray undulator beamline at the advanced light source with circular and variable linear polarization for the spectroscopy and microscopy of magnetic materials

作者：Young AT^*; Arenholz E; Feng J; Padmore H; Marks S; Schlueter R; Hoyer E; Kelez N; Steier C

来源：Surface Review and Letters, 2002, 9(1): 549-554.

DOI：10.1142/S0218625X02002622

A new undulator beamline at the Advanced Light Source, Lawrence Berkeley National Laboratory is described. This new beamline has an Apple II type undulator which produces linearly and elliptically polarized X-rays. A high resolution monochromator directs the radiation to two branchlines. The first branchline is optimized for spectroscopy and accommodates multiple endstations simultaneously. The second branchline features a photoemission electron microscope, A novel feature of the beamline is the ability to produce linearly polarized radiation at arbitrary, user-selectable angles. Applications of the new beamline are also described.

• 出版日期2002-2