A realistic projection simulator for laboratory based X-ray micro-CT

作者:Dhaene Jelle*; Pauwels Elin; De Schryver Thomas; De Muynck Amelie; Dierick Manuel; Van Hoorebeke Luc
来源:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms , 2015, 342: 170-178.
DOI:10.1016/j.nimb.2014.09.033

摘要

In X-ray computed tomography (CT) each voxel of the reconstructed image contains a calculated grey value which represents the linear attenuation coefficient for the materials in that voxel. Conventional laboratory based CT scanners use polychromatic X-ray sources and integrating detectors with an energy dependent efficiency. Consequently the reconstructed attenuation coefficients will depend on the spectrum of the source and the spectral sensitivity of the detector. Beam hardening will alter the spectrum significantly as the beam propagates through the sample. Therefore, sample composition and shape will affect the reconstructed attenuation coefficients as well. A polychromatic projection simulator has been developed at the "Centre for X-ray Tomography" of the Ghent University (UGCT) which takes into account the aforementioned variables, allowing for complete and realistic simulations of CT scans for a wide range of geometrical setups. Monte Carlo simulations of the X-ray tubes and detectors were performed to model their spectral behaviour. In this paper, the implementation and features of the program are discussed. Simulated and real. CT scans are compared to demonstrate the quantitative correctness of the simulations. Experiments performed at two different UGCT scanners yield a maximum deviation of 3.9% and 6.5% respectively, between the measured and simulated reconstructed attenuation coefficients.

  • 出版日期2015-1-1