Analysis of Dislocations Generated during Metal-Organic Vapor Phase Epitaxy of GaN on Patterned Templates

作者：Suihkonen Sami^*; Ali Muhammad; Torma Pekka T; Sintonen Sakari; Svensk Olli; Sopanen Markku; Lipsanen Harri; Nevedomsky Vladimir N; Bert Nikolay A

来源：Japanese Journal of Applied Physics, 2013, 52(1): 01AF01.

DOI：10.7567/JJAP.52.01AF01

We report on patterning and subsequent metal-organic vapor phase epitaxy overgrowth of GaN films on patterned GaN/sapphire templates. Templates with a hexagonal hole pattern were prepared by photolithography and dry etching. After GaN overgrowth voids were formed at the GaN/sapphire interface. Threading dislocations were found to bend and terminate at void sidewalls during the overgrowth resulting in improved material quality. The dislocations were analyzed by transmission electron microscopy combined with energy dispersive X-ray spectroscopy. Areas with increased Ga concentration were found at the tips of coalesced voids that introduced additional dislocations to the overgrown films.

• 出版日期2013-1