Methods for investigation of graphene properties

作者：Tsysar' M A^*; Poltoratskii V G; Novikov N V; Belyavina N N; Psyarnetskaya T A

来源：Journal of Superhard Materials, 2014, 36(5): 320-330.

DOI：10.3103/S1063457614050050

• diamond
• cubic boron nitride
• silicon oxide
• graphene coating
• atomic layer
• Raman spectroscopy
• X-ray diffraction study
• electron microscope
• scanning tunneling microscope
• a tip made of boron-doped semiconductor diamond

The paper presents the results of investigation of a graphene coating produced on different substrates, such as diamond, cubic boron nitride, and silicon oxide. Characterization of the presence of graphene structures is performed by Raman spectroscopy and X-ray diffraction study. The surface topography is studied by optical, electron, and tunneling microscopes. Functionalities of all the experimental techniques applied are discussed. The results obtained by a new instrument-a tunneling microscope fitted with a tip of boron-doped semiconductor diamond-are analyzed.

• 出版日期2014-9