A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope

作者：Lange Manfred^*; van Voerden Dennis; Moeller Rolf

来源：Beilstein Journal of Nanotechnology, 2012, 3: 207-212.

DOI：10.3762/bjnano.3.23

• atomic force microscopy
• energy dissipation
• force spectroscopy
• hysteresis loop
• PTCDA/Ag/Si(111) root 3 x root 3

Measurements of the frequency shift versus distance in noncontact atomic force microscopy (NC-AFM) allow measurements of the force gradient between the oscillating tip and a surface (force-spectroscopy measurements). When nonconservative forces act between the tip apex and the surface the oscillation amplitude is damped. The dissipation is caused by bistabilities in the potential energy surface of the tip-sample system, and the process can be understood as a hysteresis of forces between approach and retraction of the tip. In this paper, we present the direct measurement of the whole hysteresis loop in force- spectroscopy curves at 77 K on the PTCDA/Ag/Si(111) root 3 x root 3 surface by means of a tuning-fork-based NC-AFM with an oscillation amplitude smaller than the distance range of the hysteresis loop. The hysteresis effect is caused by the making and breaking of a bond between PTCDA molecules on the surface and a PTCDA molecule at the tip. The corresponding energy loss was determined to be 0.57 eV by evaluation of the force- distance curves upon approach and retraction. Furthermore, a second dissipation process was identified through the damping of the oscillation while the molecule on the tip is in contact with the surface. This dissipation process occurs mainly during the retraction of the tip. It reaches a maximum value of about 0.22 eV/cycle.

• 出版日期2012-3-8