A New Parameter of Statistic Equality of Sampling Lengths in Surface Roughness Measurement

作者：Tomov Mite^*; Kuzinovski Mikolaj; Cichosz Piotr

来源：Strojniski Vestnik-Journal of Mechanical Engineering, 2013, 59(5): 339-348.

DOI：10.5545/sv-jme.2012.606

• parameter of statistical equality of sampling lengths
• surface roughness
• roughness profile
• waviness profile
• primary profile
• mean value
• standard deviation

This paper presents the procedure for obtaining the primary profile, the waviness profile, and the roughness profile when measuring surface roughness, based on a set of recommendations from several ISO standards. An analysis was conducted and key insights into the procedure are given. In addition, a proposal to introduce a new parameter of statistical equality of sampling lengths when measuring surface roughness is included and the possible benefits from introducing the new parameter are stated.

• 出版日期2013-5