Dual layer overcoat for MR recording media

作者:Chen GL*; Wu JG; Weiss J
来源:IEEE Transactions on Magnetics, 1999, 35(5): 2364-2366.

摘要

To achieve high recording areal density, the magnetic spacing loss between the recording head and the disk must be reduced. GMR media require ultra thin overcoat. Conventional a-C:H and a-C:N media crashed easily as the thickness of overcoat reduced to less than 75 Angstrom Ion beam deposited carbon may have better wear resistance but have issues on defects and affecting magnetic performance. We have developed dual layer overcoat for MR and GMR media With SiNx, as the foundation layer and a-C:H as the top layer of overcoat, we are able to obtain good tribology performance. The peak position of FTIR spectra of SiNx films increases from 824.76 to 1140.54 cm(-1) as the ratio of nitrogen to argon increases from 0/80 to 100/80. The binding energy of Si in SiNx, increases from 100.4 eV to 102.2 eV as the nitrogen/argon ratio increases from 20/80 to 100/80. The reduced elastic modulus, E-r, of SiNx films is a function of flow ratio of argon to nitrogen. E-r value of silicon nitride film can reach 229 GPa for the nitrogen/argon ratio at 20/80.

  • 出版日期1999-9