A method to recover critical bits under a double error in SEC-DED protected memories

作者：Liu, Shanshan^*; Reviriego, Pedro; Xiao, Liyi; Antonio Maestro, Juan

来源：Microelectronics Reliability, 2017, 73: 92-96.

DOI：10.1016/j.microrel.2017.04.020

• Error correction codes
• Memory
• Single Error Correction Double Error Detection (SEC-DED)

Single Error Correction Double Error Detection (SEC-DED) codes are widely used to protect memories from soft errors due to their simple implementation. However, the limitation is that the double bit errors can just be detected but cannot be recovered by SEC-DED codes. In this paper, a method to recover some of the bits when a double error occurs is presented. This can be of interest for applications on which some bits store important information, for example control flags or the more significant bits of a value. For those, the proposed technique can in some cases determine whether those bits have been affected by the double error and when not, safely recover the correct values. However, the percentage of times that the bits can be recovered is small. The proposed scheme is also extended to increase this percentage by duplicating or triplicating the critical bits inside the word when there are spare bits. No modification to the decoding circuitry is needed, as the scheme can be implemented in the exception handler that is executed when a double error occurs. This facilitates the use of the proposed scheme in existing designs. Another option is to implement part of the scheme in hardware something that can be done with low cost.

• 出版日期2017-6
• 单位哈尔滨工业大学