Using active thermography to inspect pin-hole defects in anti-reflective coating with k-mean clustering

作者：Wang Hongjin; Hsieh Sheng Jen^*; Zhou Xunfei; Peng Bo; Singh Bhavana

来源：NDT & E International, 2015, 76: 66-72.

DOI：10.1016/j.ndteint.2015.08.006

• NDT
• Thermography
• k-means clustering
• Anti-reflection films for display screen

The study here demonstrates the capability of thermography to detect and characterize pinhole defects in a visually transparent anti-reflection (AR) film. The diameter of the pin-holes varies from 0.03 mm to 4 mm. Each inspected area was unevenly heated for 65 s. Thermal images were processed by the following steps: de-trend processing, primary edge detection based on Sobel approximation, and further edge separation based on k-means clustering. Then, the diameter of pinholes was directly measured from binary images. The proposed image processing enables thermography to detect 86 of 90 inspected areas correctly in position.

• 出版日期2015-12