A fast and accurate gamma correction based on Fourier spectrum analysis for digital fringe projection profilometry

作者：Ma S; Quan C; Zhu R^*; Chen L; Li B; Tay C J

来源：Optics Communications, 2012, 285(5): 533-538.

DOI：10.1016/j.optcom.2011.11.041

• Digital fringe projection profilometry (DFPP)
• Gamma correction
• Fourier spectrum analysis (FSA)
• Spatial-carrier fringe patterns

In digital fringe projection profilometry, the gamma effect of the used electronic devices seriously affects the accuracy of three-dimensional (3D) topography measurements. Previous gamma correction methods do not take full advantage of the Fourier spectrum of the captured spatial-carrier phase-shifting fringe patterns. Hence, dozens of phase-shifting fringe patterns are required to carry out gamma pre-calibration. In this paper, a fast and accurate gamma correction technique based on a Fourier spectrum analysis is proposed. Only two spatial-carrier fringe patterns with different pre-encoded gamma values are needed and the number of fringe patterns required for gamma pre-calibration is significantly reduced without loss of accuracy. The proposed method is validated by experiments.

• 出版日期2012-3-1
• 单位南京理工大学