A Novel Body Bias Selection Scheme for Leakage Minimization

作者：Lee Dong Su^*; Kang Sung Chan; Jun Young Hyun; Kong Bai Sun

来源：IEICE - Transactions on Electronics, 2011, E94C(9): 1490-1493.

DOI：10.1587/transele.E94.C.1490

• body bias
• leakage current
• subthreshold leakage
• junction leakage
• leakage monitoring

In this letter, a novel body bias selection scheme for minimizing the leakage of MOS transistors is presented. The proposed scheme directly monitors leakages at present and adjacent body bias voltages, and dynamically updates the voltage at which the leakage is minimized regardless of process and temperature variations. Comparison results in a 46 nm CMOS technology indicated that the proposed scheme achieved leakage reductions of up to 68% as compared to conventional body biasing schemes.

• 出版日期2011-9