A software tool for automatic analysis of selected area diffraction patterns within Digital Micrograph (TM)

作者：Wu C H^*; Reynolds W T Jr; Murayama M

来源：Ultramicroscopy, 2012, 112(1): 10-14.

DOI：10.1016/j.ultramic.2011.09.013

• Selected area diffraction pattern
• Image processing
• TEM

A software package %26quot;SADP Tools%26quot; is developed as a complementary diffraction pattern analysis tool. The core program, called AutoSADP, is designed to facilitate automated measurements of d-spacing and interplaner angles from TEM selected area diffraction patterns (SADPs) of single crystals. The software uses iterative cross correlations to locate the forward scattered beam position and to find the coordinates of the diffraction spots. The newly developed algorithm is suitable for fully automated analysis and it works well with asymmetric diffraction patterns, off-zone axis patterns, patterns with streaks, and noisy patterns such as Fast Fourier transforms of high-resolution images. The AutoSADP tool runs as a macro for the Digital Micrograph program and can determine d-spacing values and interplanar angles based on the pixel ratio with an accuracy of better than about 2%.

• 出版日期2012-1
• 单位Virginia Tech; 美国弗吉尼亚理工大学(Virginia Tech)