A Novel Model of Reliability Assessment for Circular Electrical Connectors

作者：Ren Yi; Feng Qiang; Ye Tianyuan; Sun Bo^*

来源：IEEE Transactions on Components, Packaging and Manufacturing Technology, 2015, 5(6): 755-761.

DOI：10.1109/TCPMT.2015.2419222

• Accelerated degradation test (ADT)
• contact resistance
• electrical connector
• physics of failure (PoF)
• reliability assessment

The reliability of circular electrical connectors was usually assessed according to standards like MIL-HDBK-217 (Reliability Prediction of Electronic Equipment). Given to their limitations and mislead results, a new assessment method needs to be presented. Some concerns on the physics of failure (PoF) modeling and reliability assessment of circular electrical connectors are addressed in this paper to overcome this defect. An original approach combining laboratory accelerated degradation testing (ADT) and PoF modeling is proposed for effectively assessing connector reliability. Random vibration and current stress are selected as acceleration factors that affect the contact life of electrical connectors. Then, an appropriate multiple-stresses ADT scheme is derived. The PoF model for electrical connectors under multiple stresses yielded the generalized Eyring relationship. According to the system reliability model for multiposition connectors, connectors' life follows Weibull distribution, which is derived from extreme-value distribution theory. Through ADT and data gained from tests, statistical analysis result yielded the estimated value of reliability character of MIL-C-38999 I series electrical connectors under the action of vibration and current stresses.

• 出版日期2015-6
• 单位北京航空航天大学