Scanning probe microscopy imaging of metallic nanocontacts

作者：Stoeffler D^*; Fostner S; Gruetter P; Hoffmann Vogel R

来源：Physical Review B, 2012, 85(3): 033404.

DOI：10.1103/PhysRevB.85.033404

We show scanning probe microscopy measurements of metallic nanocontacts between controlled electromigration cycles. The nanowires used for the thinning process are fabricated by shadow evaporation. The highest resolution obtained using scanning force microscopy is about 3 nm. During the first few electromigration cycles the overall slit structure of the nanocontact is formed. The slit first passes along grain boundaries and then at a later stage vertically splits grains in the course of consuming them. We find that first the whole wire is heated, and later during the thinning process as the slit forms the current runs over several smaller contacts and less power is needed.

• 出版日期2012-1-17