科研之友
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摘要
In this study, we performed single-grain-boundary characterization of ferrite films at radio and microwave frequencies using scanning microwave microscopy (SMM). The sample consisted of Fe3O4/photoresist/Fe3O4 multilayers deposited on glass substrate at 90A degrees C by spin-spray coating. SMM images were recorded at various resonant frequencies between 2.0 GHz and 8.0 GHz. These images showed higher electrical conductivity at grain boundaries than at the core of grains. This phenomenon can be explained by space-charge accumulation at the grain boundary.
- 出版日期2012-3
- 单位东北大学
