A metallography and x-ray tomography study of spall damage in ultrapure Al

作者:Qi, M. L.*; Bie, B. X.; Zhao, F. P.; Hu, C. M.; Fan, D.; Ran, X. X.; Xiao, X. H.; Yang, W. G.; Li, P.; Luo, S. N.
来源:AIP Advances, 2014, 4(7): 077118.
DOI:10.1063/1.4890310

摘要

We characterize spall damage in shock-recovered ultrapure Al with metallography and x-ray tomography. The measured damage profiles in ultrapure Al induced by planar impact at different shock strengths, can be described with a Gaussian function, and showed dependence on shock strengths. Optical metallography is reasonably accurate for damage profile measurements, and agrees within 10-25% with x-ray tomography. Full tomography analysis showed that void size distributions followed a power law with an exponent of gamma = 1.5 +/- 2.0, which is likely due to void nucleation and growth, and the exponent is considerably smaller than the predictions from percolation models.