Analysis of Depth Profiles of Hydrogen Isotopes in Structural Materials via Reflected Electron Spectroscopy

作者:Afanas'ev V P*; Afanas'ev M V; Batrakov A A; Bohmeyer W; Naujoks D; Lubenchenko A V; Markin A
来源:Journal of Surface Investigation-X-Ray Synchrotron and Neutron Techniques, 2011, 5(1): 70-74.
DOI:10.1134/S1027451011010034

摘要

Methods for measuring the layer-by-layer profiles of hydrogen in structural materials based on interpretation of the energy spectra of electrons reflected within a given spatial angle are discussed. Elastically reflected spectroscopy makes it possible to determine the hydrogen isotope content, but its implementation requires an energy resolution on the order of 1 eV. In the experimental implementation of the method based on analysis of the domelike part of the spectrum of reflected electrons, the required energy resolution of an analyzer is about 1%. Such a level of resolution makes it possible to measure the spectrum for several seconds. The possibilities of this method are illustrated with the use of hydrocarbon coatings.

  • 出版日期2011-2

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