摘要

A technique has been designed to determine the relative permittivity and dielectric loss of low loss materials using a cylindrical cavity resonator at X band. This technique has been tested over some standard materials with satisfactory results compared to some existing standard methods for measuring tan delta. The measurements are performed TE111 mode with the aid of Agilent E4418B EPM series power meter and Agilent 53150A 20 GHz frequency counter.

  • 出版日期2015