Aluminum Film-Over-Nanosphere Substrates for Deep-UV Surface-Enhanced Resonance Raman Spectroscopy

作者：Sharma Bhavya; Cardinal M Fernanda; Ross Michael B; Zrimsek Alyssa B; Bykov Sergei V; Punihaole David; Asher Sanford A; Schatz George C; Van Duyne Richard P^*

来源：Nano Letters, 2016, 16(12): 7968-7973.

DOI：10.1021/acs.nanolett.6b04296

• UV resonance Raman spectroscopy (UVRRS)
• surface-enhanced Raman spectroscopy (SERS)
• aluminum plasmonics
• film-overnanosphere substrates

We report here the first fabrication of aluminum film-over nanosphere (AIFON) substrates for UV surface-enhanced resonance Raman scattering (UVSERRS) at the deepest UV wavelength used to date (2 lambda(ex) = 229 nm). We characterize the AlFONs fabricated with two different support microsphere sizes using localized surface plasmon resonance spectroscopy, electron microscopy, SERRS of adenine, tris(bipyridine)ruthenium(II), and trans-1,2-bis(4-pyridyl)-ethylene, SERS of 6-mercapto-l-hexanol (as a nonresonant molecule), and dielectric function analysis. We find that AIFONs fabricated with the 210 nm microspheres generate an enhancement factor of approximately 10(4-s), which combined with resonance enhancement of the adsorbates provides enhancement factors greater than 10(6). These experimental results are supported by theoretical analysis of the dielectric function. Hence our results demonstrate the advantages of using AlFON substrates for deep UVSERRS enhancement and contribute to broadening the SERS application range with tunable and affordable substrates.

• 出版日期2016-12
• 单位西北大学