科研之友
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摘要
A simple relocation technique for atomic force microscopy (AFM), which takes advantage of multi-wall carbon nanotube (MWCNT), is used for investigating repeatedly the imaging of some specific species on the whole substrate with a high relocation accuracy of tens of nanometers. As an example of the application of this technique, Tapping Mode AFM ex situ study of the morphology transition induced by solvent treatment in a triblock copolymer thin film has been carried out.
- 出版日期2005-5
- 单位哈尔滨工业大学
