摘要

Plasma Optical Emission Spectroscopy was employed to investigate hysteresis process of reactive sputtering with high purity Zn target in the presence of Ar plus O-2 plasma. An optimal working point was obtained through analyzing hysteretic curve in order to deposit high quality ZnO film. Scanning Electron Microscope was used to characterize effects of various O-2 flow rate on surface crystal structure of samples. The SEM results indicate that the structure of ZnO film is strongly dependent on O-2 flow rate at constant pressure and power. Specially, At 1.6 sccm O-2 flow rate, the sample with best crystallite structure has been observed. Energy-dispersive X-ray Spectroscopy also demonstrates the relationship between the chemical compositions of ZnO films and O-2 flow rate. The film to 1.6 sccm O-2 shows the optimal atom ratio of Zn to O and the mass ratio of Zn to O. The water contact angle measurement also shows various O-2 flow rate strongly affects wettability.

全文