Migration behavior of network-modifier cations at glass surface during electrical poling

作者：Suzuki Toshio^*; Anzai Junko; Takimoto Yasuyuki; Uraji Keiichiro; Yamamoto Kiyoshi; Nishii Junji

来源：Journal of Non-Crystalline Solids, 2016, 452: 125-129.

DOI：10.1016/j.jnoncrysol.2016.08.037

• Electrical poling
• Cation migration
• Si E ' center
• C-60-XPS
• ESR

X-ray photoelectron spectroscopy with C-60-ion sputtering (C-60-XPS) and electron spin resonance (ESR) revealed the migration behavior of network-modifier cations in an electrically poled soda-lime silicate glass. The Na+-deficient layer of 700-nm thickness was confirmed at the anode side surface. The Mg2+ and Ca2+ existed in the 200-nm thick layer from the top surface were concentrated in the layer of 200-700 nm depth from the surface. Additionally the oxygen content in the 200-nm thick layer decreased by the degassing as oxygen molecules from the glass surface, which is an essential requirement for the migration of Mg2+ and Ca2+ to cathode side. The bond scission between Si-O-Si is caused by the concentrated Mg2+ and Ca2+, resulting the formation of SiO- (Mg2+ or Ca2+)(-) OSi and Si center dot (Si E' center). We have also confirmed the generation of oxygen hole center (NBOHC) and peroxy radical (POR) in the electrically poled soda-lime silicate glass.

• 出版日期2016-11-15