Detailed placement for pulse quenching enhancement in anti-radiation combinational circuit design

作者：Liu, Chang; He, Xu; Liang, Bin; Guo, Yang^*

来源：Integration, the VLSI Journal, 2018, 62: 182-189.

DOI：10.1016/j.vlsi.2018.02.014

• Pulse quenching effect
• Charge sharing effect
• SET
• Placement

Pulse width of single event transient can be shrunk by pulse quenching effect in combinational circuits. And it is found that the pulse quenching effect is closely related to the layout of the circuits. In this paper, we propose a placement method for reducing soft errors in combinational circuits by increasing the number of quenching unit and enhancing the pulse quenching effect between them. To evaluate the soft error automatically, an evaluation platform is also implemented and embedded into commercial EDA tools with our placer. Simulation results show that our proposed method can reduce the soft error vulnerabilities by 14%-26%.

• 出版日期2018-6
• 单位湖南大学