Accelerated Life Testing in Epoxy Packaged High Luminosity Light Emitting Diodes

作者：Nogueira Eduardo^*; Vazquez Manuel; Algora Carlos

来源：Journal of Electronic Packaging, 2011, 133(3): 034501.

DOI：10.1115/1.4004659

• packaged light emitting diodes
• reliability
• catastrophic failures
• ArrheniusPeck model

In this work, we have evaluated the reliability of epoxy packaged light emitting diodes (LEDs) for outdoor applications by specific tests to enhance catastrophic failures that appear under high temperature and humidity operation conditions. The different failure mechanisms were analyzed observing two main types: one is open circuit catastrophic failures induced by moisture and the other one power luminosity degradation. The influence of temperature and humidity on catastrophic failures was modelled using the Arrhenius-Peck law obtaining an activation energy of 0.87 eV and a Peck parameter of 2.29. MTTF value of 1.582 x 10(6) h at low bias current, 10 mA, has been evaluated. [DOI: 10.1115/1.4004659]

• 出版日期2011-9