Atomic force microscopy for university students: applications in biomaterials

作者：Kontomaris S V^*; Stylianou A^*

来源：European Journal of Physics, 2017, 38(3): 033003.

DOI：10.1088/1361-6404/aa5cd6

• atomic force microscopy (AFM)
• biophysics
• nanoscale imaging
• force spectroscopy
• nansocale mechanics

Atomic force microscopy (AFM) is a powerful tool used in the investigation of the structural and mechanical properties of a wide range of materials including biomaterials. It provides the ability to acquire high resolution images of biomaterials at the nanoscale. It also provides information about the response of specific areas under controlled applied force, which leads to the mechanical characterization of the sample at the nanoscale. The wide range of information provided by AFM has established it as a powerful research tool. In this paper, we present a general overview of the basic operation and functions of AFM applications in biomaterials. The basic operation of AFM is explained in detail with a focus on the real interactions that take place at the nanoscale level during imaging. AFM's ability to provide the mechanical characterization (force curves) of specific areas at the nanoscale is also explained. The basic models of applied mechanics that are used for processing the data obtained by the force curves are presented. The aim of this paper is to provide university students and young scientists in the fields of biophysics and nanotechnology with a better understanding of AFM.

• 出版日期2017-5