A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection

作者：Ahmed Badar ud din^*; Youren Wang; Ullah Rizwan; Ahmed Najam ud din

来源：Journal of Electronic Testing-Theory and Applications, 2012, 28(4): 535-540.

DOI：10.1007/s10836-012-5311-6

• Analog fault detection
• Test signal
• Test vector
• Test vector compaction
• TOPSIS
• MADM

Technique for Order preference by Similarity to Ideal Solution (TOPSIS) is a Multi Attribute Decision Making (MADM) technique employed in diverse disciplines for the prioritization of alternative options/solutions to a problem. Test vector compaction for analog fault detection is a field which is witnessing continuous growth and experimentation. This study suggests a novel TOPSIS-based approach for the compaction of analog test vector to be constituted from test signals achieved by an exhaustive search method. The compacted test vector can help to reduce the test costs while at the same time enabling the test designer to base the compaction methodology on objectively obtained deterministic data.

• 出版日期2012-8
• 单位南京航空航天大学