Advanced phasemeter for deep phase modulation interferometry

作者：Schwarze Thomas S^*; Gerberding Oliver; Cervantes Felipe Guzman; Heinzel Gerhard; Danzmann Karsten

来源：Optics Express, 2014, 22(15): 18214-18223.

DOI：10.1364/OE.22.018214

We present the development of an advanced phasemeter for the deep phase modulation interferometry technique. This technique aims for precise length measurements with a high dynamic range using little optical hardware. The advanced phasemeter uses fast ADCs and an FPGA to implement a design of multiple single-bin Fourier transforms running at high sampling rates. Non-linear noise sources in the design were analyzed and suppressed. A null measurement with an optical beatnote signal using lambda = 1064 nm was conducted. It showed a sensitivity of 0.8 mu rad/root Hz below 10 Hz and 13.3 mu rad/root Hz above, with a large dynamic range. The shown performance could enable the measuring of optical path lengths with sensitivities down to 0.14 pm/root Hz and 2.3 pm/root Hz, respectively, over several fringes in an interferometric setup.

• 出版日期2014-7-28