Application of Complementary Signals in Built-In Self Testers for Mixed-Signal Embedded Electronic Systems

作者：Zaleski Dariusz^*; Zielonko Romuald; Bartosinski Bogdan

来源：IEEE Transactions on Instrumentation and Measurement, 2010, 59(2): 345-352.

DOI：10.1109/TIM.2009.2023819

• Built-in self testers (BISTs)
• complementary signals (CSs)
• embedded electronic systems
• microcontroller-based BISTs
• testing of analog circuits

This paper concerns the implementation of shape-designed complementary signals (CSs), which were matched to the frequency characteristic of the circuit under test, in built-in self testers (BISTs), dedicated to mixed-signal embedded electronic systems for testing their analog sections. The essence of the proposed method and solution of CS BIST is low-cost realization on the base of hardware and software resources of microcontrollers that were used in contemporary embedded systems. This paper presents a description and a theoretical basis of known bipolar CSs and unipolar CSs proposed by the authors, results of investigations of metrological properties of CSs, and a solution of CS BIST and its experimental verification on the examples of testing second-and fourth-order Butterworth filters.

• 出版日期2010-2