Bonding Characteristics of Underfilled Ball Grid Array Packaging

作者：Yim Byung Seung; Il Lee Jeong; Lee Byung Hun; Shin Young Eui; Kim Jong Min^*

来源：Materials Transactions, 2015, 56(7): 974-980.

DOI：10.2320/matertrans.MI201407

• area array packaging
• ball grid array package
• material property
• mechanical reliability
• surface mount device
• underfill

In recent years, ball grid array (BGA) package has been widely used in the portable electronic device, which can offer miniaturization and increased functional density. Thus, the failure chances of package under shock and vibration environments have been increased. In this work, we investigate the effect of underfill properties on bonding characteristics of underfilled BGA packaging. Three kinds of underfill materials with different additive content were formulated. Dynamic mechanical analysis (DMA), tensile test and shear test were conducted to examine the material properties of underfill resin such as the storage modulus (E'), glass transition temperature (T-g), mechanical and adhesion strength. In addition, the three-point bending test was conducted for underfilled BGA assemblies to investigate the mechanical reliability of BGA interconnects. The results indicate that the underfill resin should have a proper T-g to ensure the mechanical properties, and modulus of toughness of underfill resin acts as an important factor rather than mechanical strength and E' (Stiffness) to ensure the mechanical reliability of BGA assembly.

• 出版日期2015