Nanoscale investigation of charge transport at the grain boundaries and wrinkles in graphene film

作者：Ahmad Muneer^*; An Hyosub; Kim Yong Seung; Lee Jae Hong; Jung Jongwan; Chun Seung Hyun; Seo Yongho

来源：Nanotechnology, 2012, 23(28): 285705.

DOI：10.1088/0957-4484/23/28/285705

The influence of grain boundaries and mechanical deformations in graphene film on the electric charge transport is investigated at nanoscale with conductive atomic force microcopy. Large area monolayer graphene samples were prepared by the chemical vapor deposition technique. Field emission scanning electron microscopy confirmed the formation of grain boundaries and the presence of wrinkles. The presence of the D-band in the Raman spectrum also indicated the existence of sharp defects such as grain boundaries. Extremely low conductivity was found at the grain boundaries and the wrinkled surface was also more resistive in comparison to the plain graphene surface. Many samples were experimented with to justify our findings by selecting different areas on the graphene surface. Uniform conductivity was found on grain boundary and wrinkle free graphene surfaces. We made channels of varied lengths by local anodic oxidation to confine the charge carrier to the smallest dimensions to better confirm the alteration in current due to grain boundaries and wrinkles. The experimental findings are discussed with reference to the implementation of graphene as transparent conductive electrode.

• 出版日期2012-7-20