Nondestructive elemental depth profiling of Japanese lacquerware 'Tamamushi-nuri' by confocal 3D-XRF analysis in comparison with micro GE-XRF

作者：Nakano Kazuhiko; Tsuji Kouichi^*

来源：X-Ray Spectrometry, 2009, 38(5): 446-450.

DOI：10.1002/xrs.1163

• micro-XRF
• 3D-XRF
• GE-XRF
• ED-XRF
• depth analysis

We have applied recently two XRF (micro x-ray fluorescence) methods [micro-Grazing Exit XRF (GE-XRF) and confocal 3D-XRF] to Japanese lacquerware 'Tamamushi-nuri.' A laboratory grazing-exit XRF (GE-XRF) instrument was developed in combination with a micro-XRF setup. A micro x-ray beam was produced by a single capillary and a pinhole aperture. Elemental x-ray images (2D images) obtained at different analyzing depths by micro GE-XRF have been reported. However, it was difficult to directly obtain depth-selective x-ray spectra and 2D images. A 3D XRF instrument using two independent polycapillary x-ray lenses and two x-ray sources (Cr and Mo targets) was also applied to the same sample. 2D XRF images of a Japanese lacquerware showed specific distributions of elements at the different depths, indicating that 'Tamamushi-nuri' lacquerware has a layered structure. The merits and disadvantages of both the micro GE-XRF and confocal micro XRF methods are discussed.

• 出版日期2009-10