Direct measurements of field-induced strain in magnetoelectric composites by X-ray diffraction studies of forbidden reflections

作者：Abes M; Koops C T; Hrkac S B; Quandt E; Bouchenoire L; Murphy B M^*; Magnussen O M

来源：Journal of Applied Physics, 2013, 113(12): 124303.

DOI：10.1063/1.4797490

Static and magnetic field induced strains at a magnetoelectric (ME) buried interface, consisting of a ZnO(001) piezoelectric substrate and an amorphous Fe58Tb42 magnetostrictive layer, were determined by measuring the intensity of the forbidden ZnO(3-31) Bragg reflection. The comparison with an uncoated ZnO substrate shows that a permanent strain is induced by the growth process. For FeTb coated ZnO, an additional static strain of (1.6 +/- 0.2) x 10(-4) relative to the pure ZnO substrate is found near the interface, which is close to that determined from the peak position shift of the allowed ZnO(4-40) Bragg reflection. Upon applying a magnetic field along the [1-10] direction, the intensity of the ZnO(3-31) forbidden Bragg reflection increases with increasing field magnitude as predicted. The induced strain, transferred to the piezoelectric ZnO substrate due to the external magnetic field acting on the magnetostriction FeTb layer, approaches a saturation value of epsilon(H) - (3.7 +/- 0.2) x 10(-4) at B >= 0.05 T, in good agreement with the results from cantilever bending measurements. These results indicate an excellent coupling at this ME interface.

• 出版日期2013-3-28