Substrate effects on the electron-beam-induced deposition of platinum from a liquid precursor

作者：Donev Eugenii U; Schardein Gregory; Wright John C; Hastings J Todd^*

来源：Nanoscale, 2011, 3(7): 2709-2717.

DOI：10.1039/c1nr10026b

Focused electron-beam-induced deposition using bulk liquid precursors (LP-EBID) is a new nanofabrication technique developed in the last two years as an alternative to conventional EBID, which utilizes cumbersome gaseous precursors. Furthermore, LP-EBID using dilute aqueous precursors has been demonstrated to yield platinum (Pt) nanostructures with as-deposited metal content that is substantially higher than the purity achieved by EBID with currently available gaseous precursors. This advantage of LP-EBID-along with the ease of use, low cost, and relative innocuousness of the liquid precursors-holds promise for its practical applicability in areas such as rapid device prototyping and lithographic mask repair. One of the feasibility benchmarks for the LP-EBID method is the ability to deposit high-fidelity nanostructures on various substrate materials. In this study, we report the first observations of performing LP-EBID on bare and metal-coated silicon-nitride membranes, and compare the resulting Pt deposits to those obtained by LP-EBID on polyimide membranes in terms of nucleation, morphology, size dependence on electron dose, and purity.

• 出版日期2011