摘要
To investigate the function of chlorination treatment, Schottky diodes with Ni/Au contact and chlorine-treated n-type GaN were fabricated. The resultant Schottky barrier height and ideality factor of the chlorine-treated Schottky diodes were improved. The corresponding increase in photoluminescence intensity and carrier lifetime of the chlorine-treated n-type GaN was achieved using photoluminescence and time-resolved photoluminescence measurements. The improved performance of chlorine-treated Schottky diodes was attributed to the reduction of surface states as a result of reduced Ga dangling bonds and the N vacancies being passivated by the formation of GaOx on the surface of n-type GaN.
- 出版日期2007-1-15
- 单位中央民族大学