Simulation of STEM-HAADF Image Contrast of Ruddlesden-Popper Faulted LaNiO3 Thin Films

作者：Coll C; Lopez Conesa L; Rebled J M; Magen C; Sanchez F; Fontcuberta J; Estrade S; Peiro F^*

来源：Journal of Physical Chemistry C, 2017, 121(17): 9300-9304.

DOI：10.1021/acs.jpcc.6b12484

LaNiO3 (LNO) thin films are widely used as electrode materials. Yet, their properties greatly depend on such parameters as strain state and defect density. In this work, we present a detailed structural characterization of epitaxial LNO thin films grown on LaAIO(3)(001). A noticeable lack of contrast between La/Ni ions occurs in selected areas as seen by scanning transmission electron microscope, high-angle annular dark-field imaging (STEM-HAADF). By using atomistic modelization and image simulations, we show that this effect, rather than signaling cation interfusion or other spurious effects, results from different Ruddlesden-Popper faulted combinations with 1/2a < 111 > relative displacement of defect free perovskite blocks, in the LaNiO3 perovskite

• 出版日期2017-5-4