摘要

The angle of incidence phi = phi(u) (min) of minimum reflectance for incident unpolarized or circularly polarized light at a dielectric-conductor interface is determined for any complex relative refractive index N = (n, k), and contours of constant phi(u) (min) in the nk plane are presented. The minimum reflectance R-u (min) at phi(u) (min) is also plotted as a function of the polar angle 0 %26lt;= theta arg(N) %26lt;= 90 degrees along each constant phi(u) (min) contour. Also presented are families of R-u-versus-phi curves for values of complex N at theta = 30 degrees, phi(u) (min) = 45 degrees to 85 degrees in steps of 10 degrees, and values of complex N at. phi(u) (min) = 75 degrees, theta = 0 degrees to 90 degrees in steps of 10 degrees. Finally, a nonpolarimetric method for the determination of n and k of optical materials, which is based on measurements of phi(u) (min) and the normal-incidence reflectance R-0, is proposed.

  • 出版日期2014-11-20