Automatic Test Stimulus Generation for Diagnosis of RF Transceivers Using Model Parameter Estimation

作者：Banerjee Aritra^*; Chatterjee Abhijit

来源：IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2015, 23(12): 3114-3118.

DOI：10.1109/TVLSI.2014.2385863

• Behavioral model
• diagnosis
• RF
• test generation

In this brief, an optimized test stimulus generation technique is proposed for model parameter computation-based diagnosis and testing, which can provide a very compact deterministic test signal and results in significant reduction in test time. The proposed test stimulus generation algorithm maximizes the accuracy with which a nonlinear solver can determine RF transceiver model parameters from raw downconverted test response data. The simulation results show that using optimized test signals, a comprehensive range of model parameters can be computed accurately using a single data acquisition. Data from experiments performed on a hardware prototype are shown to validate the proposed methodology.

• 出版日期2015-12