Measuring the Reflection Matrix of a Rough Surface

作者：Burgi, Kenneth xml^*; Marciniak, Michael; Oxley, Mark; Nauyoks, Stephen

来源：Applied Sciences-Basel, 2017, 7(6): 568.

DOI：10.3390/app7060568

• scattering
• reflection matrix
• transmission matrix
• enhancement
• phase modulation
• spatial light modulator

Phase modulation methods for imaging around corners with reflectively scattered light required illumination of the occluded scene with a light source either in the scene or with direct line of sight to the scene. The RM (reflection matrix) allows control and refocusing of light after reflection, which could provide a means of illuminating an occluded scene without access or line of sight. Two optical arrangements, one focal-plane, the other an imaging system, were used to measure the RM of five different rough-surface reflectors. Intensity enhancement values of up to 24 were achieved. Surface roughness, correlation length, and slope were examined for their effect on enhancement. Diffraction-based simulations were used to corroborate experimental results.

• 出版日期2017-6
• 单位中国人民解放军空军电子技术研究所