Analysis of reverse tunnelling current in GaInN light-emitting diodes

作者:Cho J*; Mao A; Kim J K; Son J K; Park Y; Schubert E F
来源:Electronics Letters, 2010, 46(2): 156-157.
DOI:10.1049/el.2010.3236

摘要

The characteristics of the reverse leakage current of GaInN/GaN multiple quantum well light-emitting diodes (LEDs) are examined with various n-type GaN doping concentrations and interpreted by using a tunnelling current model. Changing the doping concentration of the n-type GaN influences the tunnelling probability of electrons into the conduction band and thus the reverse leakage current. Reducing the doping concentration of the top 150 nm portion of the n-type GaN layer by half decreases the tunnelling probability, resulting in decrease of the reverse leakage current by 80% at -10 V without deterioration of any forward electrical properties of LEDs.

  • 出版日期2010-1-21